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1

Investigation of effect of strain-compensated structure and compensation limit in strained-layer multiple quantum wells

T. Tsuchiya, M. Komori, R. Tsuneta, H. Kakibayashi

Journal:

Journal of Crystal Growth

Year:

1994

Language:

english

File:

PDF, 454 KB

english, 1994

2

Developments of new concept analytical instruments for failure analyses of sub-100 nm devices

Yasuhiro Mitsui, Fumiko Yano, Hiroshi Kakibayashi, Hiroyasu Shichi, Takashi Aoyama

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 2.54 MB

english, 2001

3

An Auger electron spectroscopy-secondary ion mass spectrometry study of layers of Cu-Ni and Ag-Au alloys modified by ion bombardment

Masao Yabumoto, Hiroshi Kakibayashi, Mamoru Mohri, Kuniaki Watanabe, Toshiro Yamashina

Journal:

Thin Solid Films

Year:

1979

Language:

english

File:

PDF, 299 KB

english, 1979

4

Microstructure and magnetic properties of CoCr thin films formed on Ge layer

Futamoto, M., Honda, Y., Kakibayashi, H., Yoshida, K.

Journal:

IEEE Transactions on Magnetics

Year:

1985

Language:

english

File:

PDF, 605 KB

english, 1985

5

Electrical and structural properties of dislocations confined in a InGaAs/GaAs heterostructure

Uchida, Y., Kakibayashi, H., Goto, S.

Journal:

Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 1.17 MB

english, 1993

6

P/GaAs

Kondow, Masahiko, Kakibayashi, Hiroshi, Minagawa, Shigekazu

Journal:

Physical Review B

Year:

1989

Language:

english

File:

PDF, 878 KB

english, 1989

7

Preferred orientation control of Ge polycrystalline film by the two-step growth method

Toshio Kobayashi, Kenzo Susa, Kazumasa Takagi, Hiroshi Kakibayashi

Journal:

Journal of Crystal Growth

Year:

1986

Language:

english

File:

PDF, 1.21 MB

english, 1986

8

Ordered structure in OMVPE-grown Ga0.5In0.5P

Masahiko Kondow, Hiroshi Kakibayashi, Shigekazu Minagawa

Journal:

Journal of Crystal Growth

Year:

1988

Language:

english

File:

PDF, 417 KB

english, 1988

9

Crystalline and electronic energy structure of OMVPE-grown AlGaInP/GaAs

M. Kondow, H. Kakibayashi, S. Minagawa, Y. Inoue, T. Nishino, Y. Hamakawa

Journal:

Journal of Crystal Growth

Year:

1988

Language:

english

File:

PDF, 589 KB

english, 1988

10

Dislocation reduction in InP layers grown on sawtooth-patterned GaAs substrates

Yae Okuno, Toshihiro Kawano, Masanari Koguchi, Kuniyasu Nakamura, Hiroshi Kakibayashi

Journal:

Journal of Crystal Growth

Year:

1994

Language:

english

File:

PDF, 919 KB

english, 1994

11

Optical characterization of GaAs quantum wire microcrystals

G.P. Morgan, K. Ogawa, K. Hiruma, H. Kakibayashi, T. Katsuyama

Journal:

Solid State Communications

Year:

1991

Language:

english

File:

PDF, 482 KB

english, 1991

12

New electron microscopy for composition analysis of GaAs/AlxGa1−xAs heterointerfaces

H. Kakibayashi, F. Nagata

Journal:

Surface Science Letters

Year:

1986

Language:

english

File:

PDF, 47 KB

english, 1986

13

Evaluation of disordering at low doping concentration in selectively Si-doped Al0.3Ga0.7As/GaAs heterointerfaces

S. Goto, H. Kakibayashi, M. Kawata, T. Usagawa

Journal:

Applied Surface Science

Year:

1989

Language:

english

File:

PDF, 1.41 MB

english, 1989

14

Application of SIMS-FDS-AES combined system to surface studies—adsorption and decomposition of formic acid over clean surface of nickel

Mamoru Mohri, H. Kakibayashi, K. Watanabe, T. Yamashina

Journal:

Applications of Surface Science

Year:

1978

Language:

english

File:

PDF, 796 KB

english, 1978

15

A resonance photoionization sputtered neutral mass spectrometry instrument for submicron microarea analysis of ULSI devices

H. Shichi, S. Osabe, M. Sugaya, T. Ino, H. Kakibayashi, K. Kanehori, Y. Mitsui

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 201 KB

english, 2003

16

A sliding wafer-OMVPE scheme for fabricating subnanometer superlattices

S. Minagawa, S. Satoh, S. Nakatsuka, H. Kakibayashi

Journal:

Journal of Electronic Materials

Year:

1988

Language:

english

File:

PDF, 558 KB

english, 1988

17

Coverage dependence of the structure of Si deposited layers on a Si(001) surface investigated by reflection electron microscopy

Takahisa Doi, Masakazu Ichikawa, Shigeyuki Hosoki, Hiroshi Kakibayashi

Journal:

Surface Science

Year:

1999

Language:

english

File:

PDF, 505 KB

english, 1999

18

New electron microscopy for composition analysis of GaAs/AlxGa1−xAs heterointerfaces

H. Kakibayashi, F. Nagata

Journal:

Surface Science

Year:

1986

Language:

english

File:

PDF, 344 KB

english, 1986

19

Growth and optical properties of nanometer-scale GaAs and InAs whiskers

Hiruma, K., Yazawa, M., Katsuyama, T., Ogawa, K., Haraguchi, K., Koguchi, M., Kakibayashi, H.

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 2.31 MB

english, 1995

20

GaAs free-standing quantum-size wires

Hiruma, Kenji, Yazawa, Masamitsu, Haraguchi, Keiichi, Ogawa, Kensuke, Katsuyama, Toshio, Koguchi, Masanari, Kakibayashi, Hiroshi

Journal:

Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 1.64 MB

english, 1993

21

Three-dimensional analysis of platinum supercrystals by transmission electron microscopy and high-angle annular dark-field scanning transmission electron microscopy observations

Yamasaki †, J., Tanaka, N., Baba, N., Kakibayashi, H., Terasaki, O.

Journal:

Philosophical Magazine

Year:

2004

Language:

english

File:

PDF, 608 KB

english, 2004

22

Characterization of Solid-State Reaction of Barium Carbonate and Titanium Dioxide by Spatially Resolved Electron Energy Loss Spectroscopy

Matsumoto, Hiroaki, Kakibayashi, Hiroshi, Taniguchi, Yoshihumi, Cheng, I-Kuan, Lee, Ting-Tai, Hu, Ching-Li, Lee, Chun-Te, Fujimoto, Masayuki, Rainforth, M.

Journal:

Journal of the American Ceramic Society

Year:

2013

Language:

english

File:

PDF, 1.50 MB

english, 2013

23

Uniform p-type impurity-doped multiquantum well AlGaInP semiconductor lasers with a lasing wavelength of 633 nm at 20 °C

Tanaka, T., Yanagisawa, H., Kakibayashi, H., Minagawa, S., Kajimura, T.

Journal:

Applied Physics Letters

Year:

1991

Language:

english

File:

PDF, 699 KB

english, 1991

24

Crystallinity of InGaPAs epitaxial layers revealed in equal thickness fringes in transmission electron microscopy

Kondow, Masahiko, Kakibayashi, Hiroshi, Nishino, Taneo, Hamakawa, Yoshihiro

Journal:

Journal of Applied Physics

Year:

1989

Language:

english

File:

PDF, 741 KB

english, 1989

25

Influence of growth temperature on crystalline structure in Ga0.5In0.5P grown by organometallic vapor phase epitaxy

Kondow, Masahiko, Kakibayashi, Hiroshi, Minagawa, Shigekazu, Inoue, Youji, Nishino, Taneo, Hamakawa, Yoshihiro

Journal:

Applied Physics Letters

Year:

1988

Language:

english

File:

PDF, 599 KB

english, 1988

26

Formation of double-monolayer-height islands on a Si(001) surface by alternating current heating in molecular beam epitaxy

Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki, Kakibayashi, Hiroshi

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 506 KB

english, 1999

27

Quantum size microcrystals grown using organometallic vapor phase epitaxy

Hiruma, K., Katsuyama, T., Ogawa, K., Koguchi, M., Kakibayashi, H., Morgan, G. P.

Journal:

Applied Physics Letters

Year:

1991

Language:

english

File:

PDF, 544 KB

english, 1991

28

Dependence of GaAs-AlxGa1−xAs heterostructures on Al composition for metal-semiconductor field-effect transistor operation

Hiruma, Kenji, Mori, Mitsuhiro, Kakibayashi, Hiroji, Ihara, Ayako, Takahashi, Susumu, Yanokura, Eiji

Journal:

Journal of Applied Physics

Year:

1989

Language:

english

File:

PDF, 782 KB

english, 1989

29

Study of Co-Cr films for perpendicular magnetic recording using nuclear magnetic resonance

Yoshida, Kazuetsu, Kakibayashi, Hiroshi, Yasuoka, Hiroshi

Journal:

Journal of Applied Physics

Year:

1990

Language:

english

File:

PDF, 1.03 MB

english, 1990

30

Microarea analysis of iron and phosphorus by resonance photoionization sputtered neutral mass spectrometry

Shichi, H., Osabe, S., Sugaya, M., Kanehori, K., Kakibayashi, H., Mitsui, Y.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2007

Language:

english

File:

PDF, 1.08 MB

english, 2007

31

P alloy

Kondow, Masahiko, Kakibayashi, Hiroshi, Tanaka, Toshiaki, Minagawa, Shigekazu

Journal:

Physical Review Letters

Year:

1989

Language:

english

File:

PDF, 799 KB

english, 1989

32

[Japan Soc. of Appl. Phys Digest of Papers Microprocesses and Nanotechnology 2003. 2003 International Microprocesses and Nanotechnology Conference - Tokyo, Japan (29-31 Oct. 2003)] Digest of Papers Microprocesses and Nanotechnology 2003. 2003 International Microprocesses and Nanotechnology Conference - Development of a three-dimensional electron microscope for stereoscopic observation of nano-structures

Kakibayashi, H.

Year:

2003

Language:

english

File:

PDF, 140 KB

english, 2003

33

Structure Analysis of Oval Defect on Molecular Beam Epitaxial GaAs Layer by Cross-Sectional Transmission Electron Microscopy Observation

Kakibayashi, Hiroshi, Nagata, Fumio, Katayama, Yoshifumi, Shiraki, Yasuhiro

Journal:

Japanese Journal of Applied Physics

Year:

1984

File:

PDF, 1.42 MB

1984

34

Composition Dependence of Equal Thickness Fringes in an Electron Microscope Image of GaAs/Al x Ga 1- x As Multilayer Structure

Kakibayashi, Hiroshi, Nagata, Fumio

Journal:

Japanese Journal of Applied Physics

Year:

1985

File:

PDF, 837 KB

1985

35

Observation of OMVPE-Grown GaInP/GaAs Cross-Sections by Transmission Electron Microscopy

Minagawa, Shigekazu, Kakibayashi, Hiroshi

Journal:

Japanese Journal of Applied Physics

Year:

1985

File:

PDF, 880 KB

1985

36

Simulation Studies of a Composition Analysis by Thickness-Fringe (CAT) in an Electron Microscope Image of GaAs/Al x Ga 1- x As Superstructure

Kakibayashi, Hiroshi, Nagata, Fumio

Journal:

Japanese Journal of Applied Physics

Year:

1986

File:

PDF, 1.38 MB

1986

37

Influence of Substrate Misorientation on Surface Morphology of Be-Doped GaAs Grown by MBE

Mochizuki, Kazuhiro, Goto, Shigeo, Kakibayashi, Hiroshi, Kusano, Chuushiro

Journal:

Japanese Journal of Applied Physics

Year:

1990

File:

PDF, 942 KB

1990

38

Substrate Misorientation Effect on Be Transport during MBE Growth of GaAs

Mochizuki, Kazuhiro, Goto, Shigeo, Kakibayashi, Hiroshi, Kusano, Chuushiro

Journal:

Japanese Journal of Applied Physics

Year:

1990

File:

PDF, 843 KB

1990

39

Direct Observation of Strain Distribution in InP/In 1- x Ga x P Heterointerfaces by the Compositional Analysis by Thickness Fringe Method

Kakibayashi, Hiroshi, Itoh, Kazuhiro

Journal:

Japanese Journal of Applied Physics

Year:

1991

File:

PDF, 1.25 MB

1991

40

Crystal Structure Change of GaAs and InAs Whiskers from Zinc-Blende to Wurtzite Type

Koguchi, Masanari, Kakibayashi, Hiroshi, Yazawa, Masamitsu, Hiruma, Kenji, Katsuyama, Toshio

Journal:

Japanese Journal of Applied Physics

Year:

1992

File:

PDF, 1.87 MB

1992

41

Strained Lattice Structure Analysis of InGaAsP Multilayers Using Thickness Fringes in Transmission Electron Microscopy Images

Tsuneta, Ruriko, Tsuchiya, Tomonobu, Kakibayashi, Hiroshi

Journal:

Japanese Journal of Applied Physics

Year:

1995

File:

PDF, 1.88 MB

1995

42

Microstructure of CoCr Thin Films Prepared by Sputtering

Futamoto, Masaaki, Honda, Yukio, Kakibayashi, Hiroshi, Shimotsu, Teruho, Uesaka, Yasutarou

Journal:

Japanese Journal of Applied Physics

Year:

1985

File:

PDF, 971 KB

1985

43

Simulation Study of Noise Influence in 3-Dimensional Reconstruction using High-Angle Hollow-Cone Dark-Field Transmission Electron Microscope Images

Tsuneta, Ruriko, Nakamura, Kuniyasu, Kakibayashi, Hiroshi

Journal:

Japanese Journal of Applied Physics

Year:

1997

Language:

english

File:

PDF, 248 KB

english, 1997

44

Highly Accurate Composition Analysis of (Pb,Zr)TiO3Using a Scanning Electron Microscope/Energy Dispersive X-Ray Spectrometer

M. Suga, K. Torii, T. Kumihashi, H. Kakibayashi

Year:

2000

Language:

english

File:

PDF, 234 KB

english, 2000

45

Detection of Strain in InP/InGaP Superlattices by Dark-Field Electron Microscopy and Nano-Diffraction Technique

N. Tanaka, K. Mihama, H. Kakibayashi

Year:

1991

Language:

english

File:

PDF, 313 KB

english, 1991

46

Observation of Incoherent Images through Minute Fluctuations of Lens Excitation Current

Kakibayashi, Hiroshi, Shimotsu, Teruho, Nagata, Fumio

Journal:

Japanese Journal of Applied Physics

Year:

1984

Language:

english

File:

PDF, 689 KB

english, 1984

47

Microstructure of Visible Light Emitting Porous Silicon

Nishida, Akio, Nakagawa, Kiyokazu, Kakibayashi, Hiroshi, Shimada, Toshikazu

Journal:

Japanese Journal of Applied Physics

Year:

1992

File:

PDF, 630 KB

1992

48

Influence of Ion Sputtering on Auger Electron Spectroscopy Depth-Profiling of GaAs/AlGaAs Superstructure

F. Matsunaga, H. Kakibayashi, T. Mishima, S. Kawase

Year:

1988

File:

PDF, 378 KB

1988

49

Observation of Fe-Mn Oxidation Process Using Specimen Transfer Chamber and Ultrahigh-Vacuum Transmission Electron Microscope

M. Koguchi, H. Kakibayashi, R. Nakatani

Year:

1993

File:

PDF, 2.33 MB

1993

50

Atomic Species Analysis and Three-Dimensional Observation by High-Angle Hollow-Cone Dark-Field Transmission Electron Microscopy

H. Kakibayashi, K. Nakamura, R. Tsuneta, Y. Mitsui

Year:

1995

File:

PDF, 1.13 MB

1995